【英文标准名称】:StandardTestMethodforDeterminingtheInsulationResistanceofaMembraneSwitch
【原文标准名称】:测定薄膜开关绝缘电阻的标准试验方法
【标准号】:ASTMF1689-2005
【标准状态】:现行
【国别】:
【发布日期】:2005
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:F01.18
【标准类型】:(TestMethod)
【标准水平】:()
【中文主题词】:电阻;薄膜开关;试验;电绝缘;电气元件
【英文主题词】:insulationresistance;leakagecurrent;membraneswitch
【摘要】:Insulationresistanceisusefulfordesignverification,qualitycontrolofmaterials,andworkmanship.Lowinsulationresistancecancausehighleakagecurrents.Highleakagecurrentscanleadtodeteriorationoftheinsulationorfalsetriggeringoftheassociatedinputdevice,orboth.Specificareasoftestingare,butnotlimitedto:3.4.1Conductor/dielectric/conductorcrossingpoint.3.4.2Closeproximityofconductors,and3.4.3Anyotherconductivesurfacesuchasshieldingormetalbackingpanel.Insulationresistancemeasurementmaybedestructiveandunitsthathavebeentestedshouldbeconsideredunreliableforfutureuse.1.1Thistestmethodcoversthedeterminationoftheinsulationresistanceofamembraneswitch.1.2Thisstandarddoesnotpurporttoaddressallofthesafetyconcerns,ifany,associatedwithitsuse.Itistheresponsibilityoftheuserofthisstandardtoestablishappropriatesafetyandhealthpracticesanddeterminetheapplicabilityofregulatorylimitationspriortouse.
【中国标准分类号】:K31
【国际标准分类号】:17_220_20;29_120_40
【页数】:2P.;A4
【正文语种】: